/****************************************************************************** * 模块名称:Storage Test Task * 模块功能:FTL + FatFS 存储测试,从 defaultTask 迁入,统一由 testTask * 调度运行。正常产品构建下由 defaultTask 调用,行为与原内联逻辑一致。 * 作者:王建锋 * 创建日期:2026-08-26 ******************************************************************************/ #include #include "main.h" #include "ff.h" #define DBG_TAG "[STORAGE-TEST]" #include "dbg_log.h" #include "test_config.h" /* 破坏性用例开关 ENABLE_DESTRUCTIVE_TESTS 的唯一来源 */ #include "storage_test.h" #include "nand_ftl.h" #include "diskio.h" #include "gd5f2gq5ue.h" storage_test_stats_t g_storage_stats; #ifndef ENABLE_STORAGE_RECOVERY_TESTS /* 全套件共享的 FATFS/FIL(RAM 预算紧张:每个 static FATFS≈560B、FIL≈600B, * 各测试函数独立持有会撑爆 .bss。测试在单任务 testTask 内串行执行、从不并发, * 共用一组安全,且比"每函数一份"省下约 5KB。见产品级 RAM 溢出 L6406E) */ static FATFS fs; static FIL fil; #ifdef ENABLE_DESTRUCTIVE_TESTS /* 性能缓冲 2048B = 恰好一个 NAND 页(RAM 预算:4096 时套件链接溢出 0x604, * L6406E 实测;2048 分块仍覆盖整页写路径,128KB 总量不变) */ static uint8_t s_perf_buf[2048]; /* TC-STORAGE-01: FTL 掉电恢复(journal 持久化) * 写文件并同步落盘,随后模拟掉电(卸载 + 复位 FTL + 重新 resume),再挂载校验内容一致。 */ static void storage_test_powerloss(void) { const uint32_t len = 4096; uint8_t wbuf[512]; uint8_t rbuf[512]; UINT bw, br; uint32_t i; int ok = 0; DBG_INFO("=== Storage Test: TC-STORAGE-01 Power-loss recovery ==="); if (f_mount(&fs, "", 1) != FR_OK) { STORAGE_TEST_CHECK(0, "TC-STORAGE-01 mount"); return; } /* Phase 1: 写已知内容文件并同步 */ for (i = 0; i < sizeof(wbuf); i++) { wbuf[i] = (uint8_t)((i * 31 + 7) & 0xFF); } if (f_open(&fil, "pl.dat", FA_CREATE_ALWAYS | FA_WRITE) == FR_OK) { for (i = 0; i < len; i += sizeof(wbuf)) { f_write(&fil, wbuf, sizeof(wbuf), &bw); } f_sync(&fil); f_close(&fil); } else { STORAGE_TEST_CHECK(0, "TC-STORAGE-01 f_open(write)"); return; } /* 模拟掉电:卸载 + 复位 FTL + 重新 resume */ f_mount(&fs, "", 0); nand_ftl_deinit(); nand_ftl_init(); if (f_mount(&fs, "", 1) != FR_OK) { STORAGE_TEST_CHECK(0, "TC-STORAGE-01 remount after resume"); return; } /* Phase 2: 重新打开校验 */ if (f_open(&fil, "pl.dat", FA_READ) == FR_OK) { ok = 1; for (i = 0; i < len; i += sizeof(rbuf)) { f_read(&fil, rbuf, sizeof(rbuf), &br); for (uint32_t j = 0; j < br; j++) { if (rbuf[j] != (uint8_t)(((i + j) * 31 + 7) & 0xFF)) { ok = 0; break; } } if (!ok) break; } f_close(&fil); } else { ok = 0; } STORAGE_TEST_CHECK(ok, "TC-STORAGE-01 content survived power-loss (resume)"); f_unlink("pl.dat"); } /* TC-STORAGE-02: 大文件 / 多扇区 / 随机 seek * 写 256KB 位置相关模式文件,顺序读回比对 + 随机偏移 seek 读比对。 * 栈预算:testTask 栈 4KB,局部缓冲 4096 必然溢出栈(8 月侥幸未爆是堆使用 * 低),改 2048 = 恰好一个 NAND 整页,覆盖度等价。 */ static void storage_test_largefile(void) { const uint32_t total = 256 * 1024; const uint32_t chunk = 2048; uint8_t buf[2048]; UINT bw, br; uint32_t off, i; int ok = 1; DBG_INFO("=== Storage Test: TC-STORAGE-02 Large file / random seek ==="); if (f_mount(&fs, "", 1) != FR_OK) { STORAGE_TEST_CHECK(0, "TC-STORAGE-02 mount"); return; } /* 写:位置相关模式 */ if (f_open(&fil, "big.dat", FA_CREATE_ALWAYS | FA_WRITE) != FR_OK) { STORAGE_TEST_CHECK(0, "TC-STORAGE-02 f_open(write)"); return; } for (off = 0; off < total; off += chunk) { for (i = 0; i < chunk; i++) { buf[i] = (uint8_t)(((off + i) * 31 + 7) & 0xFF); } f_write(&fil, buf, chunk, &bw); } f_close(&fil); /* 顺序读回 */ if (f_open(&fil, "big.dat", FA_READ) != FR_OK) { STORAGE_TEST_CHECK(0, "TC-STORAGE-02 f_open(read)"); return; } for (off = 0; off < total; off += chunk) { f_read(&fil, buf, chunk, &br); if (br != chunk) { ok = 0; break; } for (i = 0; i < chunk; i++) { if (buf[i] != (uint8_t)(((off + i) * 31 + 7) & 0xFF)) { ok = 0; break; } } if (!ok) break; } STORAGE_TEST_CHECK(ok, "TC-STORAGE-02 sequential 256KB read consistent"); /* 随机 seek 读 */ if (ok) { uint32_t seek_offs[] = { 0, 33333, 131072, 200000, total - 200 }; int seek_ok = 1; for (int s = 0; s < 5; s++) { uint32_t so = seek_offs[s]; uint32_t sc = 200; if (f_lseek(&fil, so) != FR_OK) { seek_ok = 0; break; } f_read(&fil, buf, sc, &br); for (i = 0; i < sc; i++) { if (buf[i] != (uint8_t)(((so + i) * 31 + 7) & 0xFF)) { seek_ok = 0; break; } } if (!seek_ok) break; } STORAGE_TEST_CHECK(seek_ok, "TC-STORAGE-02 random seek read consistent"); } f_close(&fil); f_unlink("big.dat"); } /* TC-STORAGE-03: 坏块注入下存储写入 * 清空旧 map → 注入若干好块为坏(持久化) → 重建文件系统 → 正常写读 → 校验坏块仍被报告。 */ static void storage_test_badblock(void) { uint8_t wbuf[512], rbuf[512]; UINT bw, br; uint32_t bad[3]; int nbad = 0; int ok = 1; DBG_INFO("=== Storage Test: TC-STORAGE-03 Bad-block injection during storage ==="); /* 清空旧 dhara map,避免后续注入的坏块被旧映射引用 */ nand_ftl_format(); /* 注入:挑出厂好块标记为坏(更新并持久化 BBT) */ for (uint32_t b = 100; b < gd5f_get_usable_blocks() && nbad < 3; b++) { if (gd5f2gq5ue_is_block_bad(b) == 0) { gd5f2gq5ue_mark_block_bad(b); bad[nbad++] = b; } } if (nbad < 3) { STORAGE_TEST_CHECK(0, "TC-STORAGE-03 could not find 3 good blocks (got %d)", nbad); return; } STORAGE_TEST_CHECK(nbad == 3, "TC-STORAGE-03 injected %d bad blocks", nbad); /* 复位 FTL 使 dhara 经 is_block_bad 看到新坏块 */ f_mount(&fs, "", 0); nand_ftl_deinit(); nand_ftl_init(); /* 重建文件系统(dhara 仍会跳过坏块) */ { MKFS_PARM opts = { FM_FAT32, 0, 0, 0, 0 }; uint8_t work[FF_MAX_SS]; if (f_mkfs("", &opts, work, sizeof(work)) != FR_OK) { STORAGE_TEST_CHECK(0, "TC-STORAGE-03 f_mkfs"); return; } } if (f_mount(&fs, "", 1) != FR_OK) { STORAGE_TEST_CHECK(0, "TC-STORAGE-03 mount"); return; } /* 正常文件写读 */ for (uint32_t i = 0; i < sizeof(wbuf); i++) { wbuf[i] = (uint8_t)((i * 17 + 3) & 0xFF); } if (f_open(&fil, "bbt.dat", FA_CREATE_ALWAYS | FA_WRITE) == FR_OK) { f_write(&fil, wbuf, sizeof(wbuf), &bw); f_close(&fil); } else { STORAGE_TEST_CHECK(0, "TC-STORAGE-03 f_open(write)"); return; } if (f_open(&fil, "bbt.dat", FA_READ) == FR_OK) { f_read(&fil, rbuf, sizeof(rbuf), &br); f_close(&fil); if (br == sizeof(wbuf)) { for (uint32_t i = 0; i < sizeof(rbuf); i++) { if (rbuf[i] != wbuf[i]) { ok = 0; break; } } } else { ok = 0; } } else { ok = 0; } STORAGE_TEST_CHECK(ok, "TC-STORAGE-03 file intact with injected bad blocks"); /* 校验注入坏块仍被报告为坏(未被 dhara 占用) */ int badok = 1; for (int k = 0; k < nbad; k++) { if (gd5f2gq5ue_is_block_bad(bad[k]) != 1) { badok = 0; } } STORAGE_TEST_CHECK(badok, "TC-STORAGE-03 injected blocks still reported bad"); f_unlink("bbt.dat"); /* 注意:注入的坏块已持久化,测试设备专用;如需恢复需重建 BBT / 重新格式化 * (配套 TC-STORAGE-04 恢复测试:storage_test.h 启用 ENABLE_STORAGE_RECOVERY_TESTS * 后跑一次套件,即可清除运行时注入坏块 + 清 dhara map 回出厂态) */ } #endif /* ENABLE_DESTRUCTIVE_TESTS: s_perf_buf + TC-STORAGE-01/02/03(写、擦、坏块注入) */ /* TC-STORAGE-05: 文件名/路径合法性校验(守护 ".fschk 无限重格式化" 真根因) * 本移植 FF_USE_LFN=0,只支持严格 8.3 短名(主名≤8、扩展≤3、不以点开头)。 * 非法名字 f_open 必返 FR_INVALID_NAME(纯 RAM 名字判定、不碰盘);合法但 * 不存在的名字返 FR_NO_FILE。本测试断言两类严格可区分——一旦哪天有人把 * FR_INVALID_NAME 误归入"卷损坏"自愈集合,这条测试就是最后的机械防线。 * (详见 docs/问题记录/GD5F2GQ5UE_Trap_Records.md TRAP-GD5F-05 / AGENTS.md) */ static void storage_test_name_validation(void) { uint32_t i; int gok = 1; int bok = 1; /* 合法 8.3:FA_READ 打开 → FR_OK(存在) 或 FR_NO_FILE(不存在),均非 INVALID */ static const char *good[] = { "fschk.tmp", /* 修复后的探针名(名5+扩展3) */ "config.ini", /* 名6+扩展3 */ "12345678.txt", /* 主名 8 / 扩展 3 上限 */ "A.TXT", /* 最小合法名 */ "NOEXT", /* 无扩展 */ "1.23", /* 数字名 */ "run.log" }; /* 非法:FF_USE_LFN=0 下 create_short 必拒 → FR_INVALID_NAME */ static const char *bad[] = { ".fschk", /* 事故根因:点开头(点后当扩展域,超 3 上限) */ ".hidden", /* 点开头隐藏名风格 */ "123456789", /* 主名 9 > 8 */ "toolongname.txt", /* 主名 > 8 */ "a.toolongext", /* 扩展 > 3 */ "bad?char.txt", /* 非法字符 ? */ "star*name", /* * */ "col:on", /* : */ "ltval", /* < > */ "pipe|name" /* | */ }; DBG_INFO("=== Storage Test: TC-STORAGE-05 Filename validation ==="); if (f_mount(&fs, "", 1) != FR_OK) { STORAGE_TEST_CHECK(0, "TC-STORAGE-05 mount"); return; } for (i = 0; i < (uint32_t)(sizeof(good) / sizeof(good[0])); i++) { FRESULT r = f_open(&fil, good[i], FA_READ); if (r == FR_OK) { f_close(&fil); } if (r == FR_INVALID_NAME) { gok = 0; DBG_ERROR(" valid name wrongly rejected: '%s'", good[i]); } } STORAGE_TEST_CHECK(gok, "TC-STORAGE-05 valid 8.3 names accepted"); for (i = 0; i < (uint32_t)(sizeof(bad) / sizeof(bad[0])); i++) { FRESULT r = f_open(&fil, bad[i], FA_READ); if (r == FR_OK) { f_close(&fil); } /* 含 ':' 的名字被 FatFs 先解析为盘符前缀 → FR_INVALID_DRIVE(11) * 同样属合法拒绝(台架实测 'col:on' fr=11),与 INVALID 同等待遇 */ if ((r != FR_INVALID_NAME) && !((r == FR_INVALID_DRIVE) && (strchr(bad[i], ':') != NULL))) { bok = 0; DBG_ERROR(" invalid name NOT rejected: '%s' -> fr=%d", bad[i], (int)r); } } STORAGE_TEST_CHECK(bok, "TC-STORAGE-05 invalid names rejected (FR_INVALID_NAME)"); } #ifdef ENABLE_DESTRUCTIVE_TESTS /* 打开模式与写回字节数语义(守护 FA_OPEN_APPEND / 短写陷阱) * 本移植 FA_OPEN_APPEND 不含 FA_WRITE → 不带写位打开 f_write 必返 FR_DENIED; * 追加写必须 FA_WRITE|FA_OPEN_APPEND。另 f_write 簇耗尽返 FR_OK+短写(无错误 * 码),判成败必须校验写回字节数。锁定这两条移植专有语义防回归。 */ static void storage_test_open_modes(void) { UINT bw; FRESULT r; DBG_INFO("=== Storage Test: Open-mode semantics ==="); if (f_mount(&fs, "", 1) != FR_OK) { STORAGE_TEST_CHECK(0, "mount"); return; } (void)f_unlink("mode.tmp"); /* 1) 建一个含初始内容的文件 */ r = f_open(&fil, "mode.tmp", FA_CREATE_ALWAYS | FA_WRITE); STORAGE_TEST_CHECK(r == FR_OK, "create base file"); if (r == FR_OK) { f_write(&fil, "abc", 3, &bw); f_close(&fil); } /* 2) FA_OPEN_APPEND(无 FA_WRITE)→ 写必返 FR_DENIED */ r = f_open(&fil, "mode.tmp", FA_OPEN_APPEND); STORAGE_TEST_CHECK(r == FR_OK, "open append(no write)"); if (r == FR_OK) { FRESULT wr = f_write(&fil, "xyz", 3, &bw); STORAGE_TEST_CHECK(wr == FR_DENIED, "append-no-write must DENY (fr=%d)", (int)wr); f_close(&fil); } /* 3) FA_WRITE|FA_OPEN_APPEND → 追加成功且字节数正确 */ r = f_open(&fil, "mode.tmp", FA_WRITE | FA_OPEN_APPEND); STORAGE_TEST_CHECK(r == FR_OK, "open write|append"); if (r == FR_OK) { (void)f_write(&fil, "xyz", 3, &bw); STORAGE_TEST_CHECK(bw == 3, "append byte-count (%u)", bw); f_close(&fil); } /* 4) 只读打开后写 → 必返 FR_DENIED(读句柄不可写) */ r = f_open(&fil, "mode.tmp", FA_READ); STORAGE_TEST_CHECK(r == FR_OK, "open read-only"); if (r == FR_OK) { FRESULT wr = f_write(&fil, "q", 1, &bw); STORAGE_TEST_CHECK(wr == FR_DENIED, "read-only write must DENY (fr=%d)", (int)wr); f_close(&fil); } (void)f_unlink("mode.tmp"); } #endif /* ENABLE_DESTRUCTIVE_TESTS: 打开模式语义 */ #endif /* !ENABLE_STORAGE_RECOVERY_TESTS: 共享缓冲 + 正常测试函数 */ #ifdef ENABLE_STORAGE_RECOVERY_TESTS static void storage_test_recover(void); #endif #ifndef ENABLE_STORAGE_RECOVERY_TESTS /* 正常存储测试套件主体(恢复模式见文件末尾 storage_test_run 分发) */ static void storage_test_run_normal(void) { FRESULT res; memset(&g_storage_stats, 0, sizeof(g_storage_stats)); #ifdef ENABLE_DESTRUCTIVE_TESTS DBG_INFO("mode: DESTRUCTIVE (write/erase/format/badblock-inject enabled)"); #else DBG_INFO("mode: READ-ONLY (destructive cases skipped; set " "ENABLE_DESTRUCTIVE_TESTS in test_config.h to run them)"); #endif /* ==================== 挂载 ==================== */ res = f_mount(&fs, "", 1); #ifdef ENABLE_DESTRUCTIVE_TESTS if (res == FR_NO_FILESYSTEM) { static uint8_t work[FF_MAX_SS]; MKFS_PARM opts = { FM_FAT32, 0, 0, 0, 0 }; res = f_mkfs("", &opts, work, sizeof(work)); STORAGE_TEST_CHECK(res == FR_OK, "f_mkfs"); res = f_mount(&fs, "", 1); } #else if (res == FR_NO_FILESYSTEM) { DBG_INFO("read-only mode: no filesystem on volume, skip write cases " "(mkfs self-heal disabled)"); } #endif STORAGE_TEST_CHECK(res == FR_OK, "f_mount"); #ifdef ENABLE_DESTRUCTIVE_TESTS /* ==================== FTL + FatFS 文件系统测试 ==================== */ { char read_buf[64]; const char *test_str = "Hello FatFS + dhara FTL!"; if (res == FR_OK) { UINT bw, br; res = f_open(&fil, "test.txt", FA_CREATE_ALWAYS | FA_WRITE); STORAGE_TEST_CHECK(res == FR_OK, "f_open(write)"); if (res == FR_OK) { f_write(&fil, test_str, (UINT)strlen(test_str), &bw); STORAGE_TEST_CHECK(bw == (UINT)strlen(test_str), "f_write (%u bytes)", bw); f_close(&fil); res = f_open(&fil, "test.txt", FA_READ); STORAGE_TEST_CHECK(res == FR_OK, "f_open(read)"); if (res == FR_OK) { f_read(&fil, read_buf, (UINT)(sizeof(read_buf) - 1), &br); f_close(&fil); read_buf[br] = '\0'; STORAGE_TEST_CHECK(br == (UINT)strlen(test_str) && memcmp(test_str, read_buf, br) == 0, "data verify \"%s\"", read_buf); } } f_unlink("test.txt"); } } /* ==================== FTL + FatFS 性能测试 ==================== */ DBG_INFO("=== Storage Test: Performance ==="); { FIL pfile; UINT pw, pr; uint32_t t0, tw, tr; uint32_t i; uint32_t total_kb = 128; uint32_t chunk = sizeof(s_perf_buf); uint32_t count = (total_kb * 1024) / chunk; memset(s_perf_buf, 0xA5, sizeof(s_perf_buf)); /* 写入 */ t0 = HAL_GetTick(); if (f_open(&pfile, "perf.dat", FA_CREATE_ALWAYS | FA_WRITE) == FR_OK) { for (i = 0; i < count; i++) { f_write(&pfile, s_perf_buf, chunk, &pw); } f_close(&pfile); } tw = HAL_GetTick() - t0; /* 读取 */ t0 = HAL_GetTick(); if (f_open(&pfile, "perf.dat", FA_READ) == FR_OK) { for (i = 0; i < count; i++) { f_read(&pfile, s_perf_buf, chunk, &pr); } f_close(&pfile); } tr = HAL_GetTick() - t0; f_unlink("perf.dat"); if (tw > 0) { DBG_INFO(" Write: %lu KB in %lu ms = %lu KB/s", total_kb, tw, (total_kb * 1000) / tw); } if (tr > 0) { DBG_INFO(" Read: %lu KB in %lu ms = %lu KB/s", total_kb, tr, (total_kb * 1000) / tr); } } #endif /* ENABLE_DESTRUCTIVE_TESTS: 文件系统写读 + 性能压测 */ /* ==================== 存储集成测试(TC-STORAGE-05 契约 + 01~03 集成) ========== */ /* 纯语义契约测试(非破坏性):文件名合法性 */ storage_test_name_validation(); #ifdef ENABLE_DESTRUCTIVE_TESTS /* 破坏性用例:打开模式契约 + 掉电恢复 / 大文件 / 坏块注入集成 */ storage_test_open_modes(); storage_test_powerloss(); storage_test_largefile(); storage_test_badblock(); #endif /* ==================== 汇总报告 ==================== */ STORAGE_TEST_REPORT("Storage Tests"); } #endif /* !ENABLE_STORAGE_RECOVERY_TESTS */ /* * 套件总入口分发。恢复模式(storage_test.h 打开 ENABLE_STORAGE_RECOVERY_TESTS) * = 专用维护构建:重建 BBT(清除运行时误标坏块)+ 清 dhara map 后直接返回, * 不在受污染介质上继续跑其余测试(2026-09-20:CCM 首轮实验中 DMA 够不到栈上 * 小缓冲,随机块被误标坏并持久化,journal 引用到即静默卡死——恢复模式即为其 * 清账手段)。恢复完成后重新注释该宏、编译正常套件即可。 */ void storage_test_run(void) { #ifdef ENABLE_STORAGE_RECOVERY_TESTS storage_test_recover(); STORAGE_TEST_REPORT("Storage Recovery"); #else storage_test_run_normal(); #endif } #ifdef ENABLE_STORAGE_RECOVERY_TESTS #ifdef STORAGE_RECOVERY_FULL_WIPE /* * 函数功能:擦净 dhara 可见区全部块(容量恢复用) * 入口参数:无 * 返回值:无 * 限定条件:SPI/驱动已初始化;调用期间无其它存储访问(测试构建下单写者) * 函数说明:逐块擦除 [0, gd5f_get_usable_blocks()),跳过 BBT 记录的坏块, * 保留块池(BBT 存储区)不动。擦净后 journal checkpoint 不复存在, * 下次启动 dhara_map_resume 失败 → dhara_map_clear 全新初始化 * (bb_last = bb_current = 0)→ 容量回满。 * 注意:擦净后**不能**再调 nand_ftl_format()(会把内存中仍带旧坏块 * 计数的 journal 状态重新落盘,容量又被扣掉)。 */ static void storage_test_wipe_visible(void) { uint32_t usable = gd5f_get_usable_blocks(); uint32_t done = 0; uint32_t skipped = 0; uint32_t b; for (b = 0; b < usable; b++) { if (gd5f2gq5ue_is_block_bad(b) != 0) { skipped++; continue; } if (gd5f_block_erase(b) == GD5F_OK) { done++; } else { DBG_ERROR(" block %lu erase failed", (unsigned long)b); } if ((b % 256U) == 0U) { DBG_INFO(" wipe progress: %lu/%lu", (unsigned long)b, (unsigned long)usable); } } DBG_INFO(" wiped %lu blocks (%lu skipped as bad, %lu visible)", (unsigned long)done, (unsigned long)skipped, (unsigned long)usable); STORAGE_TEST_CHECK(done > 0U, "TC-STORAGE-04 full wipe (%lu blocks erased)", (unsigned long)done); } #endif /* STORAGE_RECOVERY_FULL_WIPE */ /* TC-STORAGE-04: 维护模式(恢复 = 重建 BBT + 重新格式化;叠加全片擦除 = 容量恢复) * 仅在启用 ENABLE_STORAGE_RECOVERY_TESTS 时编译运行;运行一次即可把设备 * 恢复到干净出厂态(清除运行时注入坏块并清空 dhara map)。 */ static void storage_test_recover(void) { DBG_INFO("=== Storage Test: TC-STORAGE-04 maintenance (recovery / full wipe) ==="); int r = gd5f2gq5ue_bbt_rebuild(); STORAGE_TEST_CHECK(r == GD5F_OK, "TC-STORAGE-04 bbt rebuild"); #ifdef STORAGE_RECOVERY_FULL_WIPE storage_test_wipe_visible(); #else nand_ftl_format(); STORAGE_TEST_CHECK(1, "TC-STORAGE-04 nand_ftl_format done"); #endif uint8_t fb[GD5F_TOTAL_BLOCKS / 8]; uint32_t ver = 0; if (gd5f_bbt_dump_flash(fb, &ver) == GD5F_OK) { STORAGE_TEST_CHECK(ver >= 1, "TC-STORAGE-04 persisted BBT version=%lu", ver); } else { STORAGE_TEST_CHECK(0, "TC-STORAGE-04 dump_flash failed"); } #ifdef STORAGE_RECOVERY_FULL_WIPE DBG_INFO("TC-STORAGE-04 full wipe complete; power-cycle to rebuild fresh " "(capacity expected back to full)"); #else DBG_INFO("TC-STORAGE-04 recovery complete; recommend power-cycle to re-init cleanly"); #endif } #endif