wandering1
f754d59218
分层：流程与规范/ 单元测试/ 板级测试/ 专项验证/ 测试工具/ 测试数据/， 顶层只留新增的目录导航 README.md（归层判据 + 硬约束 + 本次处置记录）。 - 搬迁 28 个路径：测试数据三个目录 58 个文件为纯改名（R100，内容逐字节不变） - 全库引用同步 124 个文件：AGENTS / docs 索引 / skills / 门禁注释 / scripts - 门禁面：scripts/check_test_traceability.py 的 glob 改 rglob （分层后不递归扫描＝追溯门禁直接瞎掉） - scripts/rename_ref.py：收尾的 ℹ 提示在 GBK 代码页抛 UnicodeEncodeError， 让进程以退出码 1 收场而改写其实已落盘（RC 与真实结果相反）；改为把 stdout/stderr reconfigure 成 UTF-8，与 check_doc_links.py 等同法 - docs/文档规范.md §1.1 补「子目录文件过多时再分一层」；§3.6 补 rename_ref 搬整目录的两个实测坑：① 会改写目录内部文件的内容 ② 内部文件的 ../ 出链 不补层级（本次 23 个被误改的证据文件已按 HEAD 原始字节逐字节还原） - docs/README.md §6 改为与六个子目录一一对应，并补登原先漏登记的 「启动日志原子性复验流程」一行 - .cubemx_survival_baseline.json：App/util/task_watchdog.c 的注释路径也随分层更新， 该文件是存活审计的 watchdog-module 漂移锚点，按脚本自己的提示跑 --write 重建基线 （实测重建后仅 watchdog-module 一条哈希变化） - 铁律 4 例外（本次在任务树里改了单写者文件）：AGENTS.md 与 .pre-commit-config.yaml 只被 rename_ref 改写路径字面量（后者全在注释行）， 任务表块与钩子声明一字未动 验证：check_doc_links.py --sections-strict 覆盖全部 88 个改动 .md 全绿； check_test_traceability.py 输出与主树逐行一致；196 个文本文件无 BOM、无新增 CR、无 U+FFFD、无行尾空白；陈旧引用面由主树 25 处降到 6 处（无新增断链）。
275 lines
11 KiB
C
275 lines
11 KiB
C
/******************************************************************************
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* 模块名称：SD2506 RTC Test Suite
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* 模块功能：SD2506API-G RTC 驱动功能自测（黑盒，仅用公共 API）。
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*
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* 历史背景：本驱动曾出现"时间写不进"问题，根因是 sd2506.h 中寄存器宏写成
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* "0x0FH"（H 后缀）。KEIL/ARMCC 不识别 H 整数后缀，将其编译为 0，
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* 导致 SD2506_REG_CTR1 实际等于 0（秒寄存器），sd2506_write_enable()
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* 把 WRTC 写到了错误寄存器，写保护永不解除。修正为 "0x0FU" 后恢复。
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* 详见 docs/问题记录/SD2506_Trap_Records.md。
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*
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* 当前测试：Phase 1 基本读写（init / 读 / 写 / 回读一致 / 走时），
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* 结束后自动恢复板子原始时间。
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* 入口：sd2506_test_run()（由 start_test_task 经 TEST_SUITE_RTC 调度）
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* 创建日期：2026-08-28
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******************************************************************************/
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#include <string.h>
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#include <stdint.h>
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#include "sd2506_test.h"
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#include "test_config.h"
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#include "cmsis_os.h"
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#include "sd2506.h"
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#define DBG_TAG "[RTC_TEST]"
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#include "dbg_log.h"
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#ifdef TEST_SUITE_RTC
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/* 全局测试统计（宏自动管理） */
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sd2506_test_stats_t g_sd2506_test_stats;
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/* ===================== Phase 1：基本读写 ===================== */
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#ifdef ENABLE_RTC_BASIC_TESTS
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static void sd2506_phase_basic(void)
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{
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DBG_INFO("=== SD2506 Phase 1: basic read/write (public API) ===");
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/* TC-RTC-001: init + 读取当前时间 */
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bsp_err_t ret = sd2506_init();
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SD2506_TEST_CHECK(ret == BSP_OK, "sd2506_init() ret=%d (expect 0)", ret);
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sd2506_time_t r;
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ret = sd2506_get_time(&r);
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SD2506_TEST_CHECK(ret == BSP_OK, "sd2506_get_time() ret=%d (expect 0)", ret);
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if (ret == BSP_OK) {
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DBG_INFO(" current RTC: %04u-%02u-%02u %02u:%02u:%02u wk=%u",
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(unsigned int)r.year, (unsigned int)r.month, (unsigned int)r.day,
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(unsigned int)r.hour, (unsigned int)r.minute,
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(unsigned int)r.second, (unsigned int)r.week);
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}
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/* TC-RTC-002: 写固定时间，立即回读比对（破坏性：改设备 RTC 时间，套件结束会复原）。
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* 若 FAIL -> 先查 sd2506.h 寄存器宏后缀是否为 H（曾因 0x0FH 被 KEIL 编译为 0
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* 导致 SD2506_REG_CTR1 指向秒寄存器、WRTC 写错地址）。详见 docs/问题记录/SD2506_Trap_Records.md。 */
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#ifdef ENABLE_DESTRUCTIVE_TESTS
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{
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sd2506_time_t t;
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int match;
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t.year = 2026; t.month = 8; t.day = 28; t.hour = 12; t.minute = 0; t.second = 0; t.week = 4;
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ret = sd2506_set_time(&t);
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SD2506_TEST_CHECK(ret == BSP_OK, "sd2506_set_time() ret=%d (expect 0)", ret);
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ret = sd2506_get_time(&r);
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SD2506_TEST_CHECK(ret == BSP_OK, "sd2506_get_time() after set ret=%d (expect 0)", ret);
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if (ret == BSP_OK) {
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DBG_INFO(" set : %04u-%02u-%02u %02u:%02u:%02u",
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(unsigned int)t.year, (unsigned int)t.month, (unsigned int)t.day,
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(unsigned int)t.hour, (unsigned int)t.minute, (unsigned int)t.second);
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DBG_INFO(" readback: %04u-%02u-%02u %02u:%02u:%02u",
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(unsigned int)r.year, (unsigned int)r.month, (unsigned int)r.day,
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(unsigned int)r.hour, (unsigned int)r.minute, (unsigned int)r.second);
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}
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match = (r.year == t.year && r.month == t.month && r.day == t.day &&
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r.hour == t.hour && r.minute == t.minute &&
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(r.second == t.second || r.second == ((t.second + 1U) % 60U)));
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SD2506_TEST_CHECK(match, "set==readback (in-session write takes effect)");
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}
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#else
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DBG_INFO("TC-RTC-002 skipped: destructive tests disabled (RTC time write)");
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#endif
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/* TC-RTC-003: 走时。写后等 3s，应前进约 3 秒 */
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if (ret == BSP_OK) {
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osDelay(3000);
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sd2506_time_t r2;
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bsp_err_t ret2 = sd2506_get_time(&r2);
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if (ret2 == BSP_OK) {
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int adv = (r2.second + 60 * (r2.minute + 60 * (r2.hour + 24 * r2.day)))
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- (r.second + 60 * (r.minute + 60 * (r.hour + 24 * r.day)));
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if (adv < 0) adv += 60 * 60 * 24 * 32;
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DBG_INFO(" 3s later: %04u-%02u-%02u %02u:%02u:%02u (advanced %d s)",
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(unsigned int)r2.year, (unsigned int)r2.month, (unsigned int)r2.day,
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(unsigned int)r2.hour, (unsigned int)r2.minute, (unsigned int)r2.second, adv);
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SD2506_TEST_CHECK(adv >= 2 && adv <= 5, "RTC ticking forward (~3s)");
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}
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}
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SD2506_TEST_REPORT("Phase 1 basic");
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}
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#endif /* ENABLE_RTC_BASIC_TESTS */
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/* ===================== Phase 2：全功能 API 覆盖 ===================== */
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#ifdef ENABLE_RTC_API_TESTS
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static void sd2506_phase_api(void)
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{
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DBG_INFO("=== SD2506 Phase 2: full API coverage ===");
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/* TC-RTC-010: BCD<->DEC 互转（纯算法，确定性，无需硬件交互） */
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int conv_ok = 1;
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uint8_t samples[][2] = {
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{0, 0x00U}, {1, 0x01U}, {9, 0x09U}, {10, 0x10U}, {23, 0x23U},
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{59, 0x59U}, {60, 0x60U}, {99, 0x99U}, {42, 0x42U}, {88, 0x88U}
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};
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for (uint32_t i = 0U; i < (sizeof(samples) / sizeof(samples[0])); i++) {
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uint8_t dec = samples[i][0];
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uint8_t bcd = samples[i][1];
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if (sd2506_dec_to_bcd(dec) != bcd) {
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conv_ok = 0;
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DBG_ERROR(" dec_to_bcd(%u) != 0x%02X", (unsigned int)dec, (unsigned int)bcd);
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}
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if (sd2506_bcd_to_dec(bcd) != dec) {
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conv_ok = 0;
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DBG_ERROR(" bcd_to_dec(0x%02X) != %u", (unsigned int)bcd, (unsigned int)dec);
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}
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}
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SD2506_TEST_CHECK(conv_ok, "bcd<->dec round-trip (10 samples)");
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/* TC-RTC-011: 内部温度读取 */
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int8_t temp = 0;
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bsp_err_t ret = sd2506_get_temperature(&temp);
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SD2506_TEST_CHECK(ret == BSP_OK, "sd2506_get_temperature() ret=%d (expect 0)", ret);
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if (ret == BSP_OK) {
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DBG_INFO(" temperature: %d C", (int)temp);
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SD2506_TEST_CHECK(temp >= -40 && temp <= 85,
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"temperature in range [-40,85]: %d", (int)temp);
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}
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/* TC-RTC-012: 电池电压（毫伏） */
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uint16_t volt = 0U;
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ret = sd2506_get_battery_voltage(&volt);
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SD2506_TEST_CHECK(ret == BSP_OK, "sd2506_get_battery_voltage() ret=%d (expect 0)", ret);
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if (ret == BSP_OK) {
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DBG_INFO(" battery: %u mV", (unsigned int)volt);
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SD2506_TEST_CHECK(volt > 2000U && volt < 5000U,
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"battery voltage plausible: %u mV", (unsigned int)volt);
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}
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/* TC-RTC-013: 芯片 8 字节 ID */
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uint8_t id[8] = {0};
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ret = sd2506_get_id(id);
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SD2506_TEST_CHECK(ret == BSP_OK, "sd2506_get_id() ret=%d (expect 0)", ret);
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if (ret == BSP_OK) {
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DBG_INFO(" id: %02X%02X%02X%02X%02X%02X%02X%02X",
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id[0], id[1], id[2], id[3], id[4], id[5], id[6], id[7]);
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}
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/* TC-RTC-014: 用户 SRAM 读写回环（addr=0, len=8；破坏性：写芯片 SRAM） */
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#ifdef ENABLE_DESTRUCTIVE_TESTS
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{
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uint8_t wbuf[8] = {0xA1U, 0xB2U, 0xC3U, 0xD4U, 0xE5U, 0xF6U, 0x07U, 0x18U};
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uint8_t rbuf[8] = {0};
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ret = sd2506_write_sram(0U, wbuf, 8U);
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SD2506_TEST_CHECK(ret == BSP_OK, "sd2506_write_sram() ret=%d (expect 0)", ret);
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if (ret == BSP_OK) {
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ret = sd2506_read_sram(0U, rbuf, 8U);
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SD2506_TEST_CHECK(ret == BSP_OK, "sd2506_read_sram() ret=%d (expect 0)", ret);
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int sram_ok = (memcmp(wbuf, rbuf, 8U) == 0);
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SD2506_TEST_CHECK(sram_ok, "SRAM write==readback");
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}
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}
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#else
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DBG_INFO("TC-RTC-014 skipped: destructive tests disabled (RTC SRAM write)");
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#endif
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/* TC-RTC-015: 报警设置 + 清除（破坏性：写报警寄存器；验证 API 通路，不影响时间寄存器） */
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#ifdef ENABLE_DESTRUCTIVE_TESTS
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{
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sd2506_time_t at;
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at.year = 2026; at.month = 8; at.day = 28; at.hour = 12; at.minute = 0; at.second = 30; at.week = 4;
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ret = sd2506_set_alarm(&at, (uint8_t)(SD2506_AL_EN_EAS | SD2506_AL_EN_EAMN));
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SD2506_TEST_CHECK(ret == BSP_OK, "sd2506_set_alarm() ret=%d (expect 0)", ret);
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ret = sd2506_clear_alarm();
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SD2506_TEST_CHECK(ret == BSP_OK, "sd2506_clear_alarm() ret=%d (expect 0)", ret);
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}
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#else
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DBG_INFO("TC-RTC-015 skipped: destructive tests disabled (RTC alarm write)");
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#endif
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SD2506_TEST_REPORT("Phase 2 API");
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}
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#endif /* ENABLE_RTC_API_TESTS */
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/* ===================== 套件入口 ===================== */
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void sd2506_test_run(void)
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{
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DBG_INFO("SD2506 test suite started");
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#ifdef ENABLE_DESTRUCTIVE_TESTS
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DBG_INFO("mode: DESTRUCTIVE (RTC time / SRAM / alarm writes enabled)");
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#else
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DBG_INFO("mode: READ-ONLY (destructive cases skipped; set "
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"ENABLE_DESTRUCTIVE_TESTS in test_config.h to run them)");
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#endif
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bsp_err_t ret = sd2506_init();
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SD2506_TEST_CHECK(ret == BSP_OK, "sd2506_init() ret=%d (expect 0)", ret);
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/* 信息：读取 CTR1 默认状态（确认 WRTC 初始/可写能力，纯诊断） */
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uint8_t c1 = 0x00U;
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if (sd2506_read_ctr1(&c1) == BSP_OK) {
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DBG_INFO(" CTR1=0x%02X (WRTC2=CTR1.2=%u WRTC3=CTR1.7=%u)",
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(unsigned int)c1,
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(unsigned int)((c1 >> 2) & 1U),
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(unsigned int)((c1 >> 7) & 1U));
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}
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#ifdef ENABLE_DESTRUCTIVE_TESTS
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/* 记录原始时间，测试结束恢复，避免把板子时间留在测试值 */
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sd2506_time_t orig;
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int have_orig = (sd2506_get_time(&orig) == BSP_OK);
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if (!have_orig) {
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DBG_INFO(" WARN: cannot read original time; restore step will be skipped");
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}
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#endif
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/* 套件级累计：每个 Phase 进入前自清零，阶段结束后把本阶段结果累加进来。
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* 目的有二：
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* 1) 各 Phase 的 `=== Phase N ... ===` 汇总行只反映"本阶段"的断言数，
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* 不再出现"Phase 2 显示的是含 Phase 1 的累计值"这种易误读输出；
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* 2) 末尾输出套件级 `=== RTC Tests: N/M PASSED (failed=0) ===` 汇总行——
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* 它是 run_all_suites.py --require-suite-summary 的判定标记
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* （见 test_common.h / docs/测试说明/流程与规范/测试开发标准流程.md §3.2）。 */
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uint16_t suite_total = 0U;
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uint16_t suite_passed = 0U;
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uint16_t suite_failed = 0U;
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#ifdef ENABLE_RTC_BASIC_TESTS
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memset(&g_sd2506_test_stats, 0, sizeof(g_sd2506_test_stats));
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sd2506_phase_basic();
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suite_total += g_sd2506_test_stats.total;
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suite_passed += g_sd2506_test_stats.passed;
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suite_failed += g_sd2506_test_stats.failed;
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#endif
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#ifdef ENABLE_RTC_API_TESTS
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memset(&g_sd2506_test_stats, 0, sizeof(g_sd2506_test_stats));
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sd2506_phase_api();
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suite_total += g_sd2506_test_stats.total;
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suite_passed += g_sd2506_test_stats.passed;
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suite_failed += g_sd2506_test_stats.failed;
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#endif
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#ifdef ENABLE_DESTRUCTIVE_TESTS
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/* 恢复原始时间（用公共 API，写保护逻辑已由 sd2506.c 正确处理） */
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if (have_orig) {
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int r = sd2506_set_time(&orig);
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DBG_INFO(" restored original time (ret=%d)", r);
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}
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#endif
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/* 套件级汇总行：名称固定 "RTC Tests"，与 run_all_suites.py 的
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* --require-suite-summary 约定一致。复用公共报告宏，保证格式统一。 */
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g_sd2506_test_stats.total = suite_total;
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g_sd2506_test_stats.passed = suite_passed;
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g_sd2506_test_stats.failed = suite_failed;
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SD2506_TEST_REPORT("RTC Tests");
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DBG_INFO("SD2506 test suite done");
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for (;;) {
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osDelay(1000);
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}
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}
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#endif /* TEST_SUITE_RTC */
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