STM32F4-Base/test/board/storage_test_task.c

/******************************************************************************
 * 模块名称：Storage Test Task
 * 模块功能：FTL + FatFS 存储测试，从 defaultTask 迁入，统一由 testTask
 *          调度运行。正常产品构建下由 defaultTask 调用，行为与原内联逻辑一致。
 * 作者：王建锋
 * 创建日期：2026-08-26
 ******************************************************************************/

#include <string.h>
#include "main.h"
#include "ff.h"

#define DBG_TAG "[STORAGE-TEST]"
#include "dbg_log.h"
#include "test_config.h"   /* 破坏性用例开关 ENABLE_DESTRUCTIVE_TESTS 的唯一来源 */
#include "storage_test.h"
#include "nand_ftl.h"
#include "diskio.h"
#include "gd5f2gq5ue.h"

storage_test_stats_t g_storage_stats;

#ifndef ENABLE_STORAGE_RECOVERY_TESTS
/* 全套件共享的 FATFS/FIL（RAM 预算紧张：每个 static FATFS≈560B、FIL≈600B，
 * 各测试函数独立持有会撑爆 .bss。测试在单任务 testTask 内串行执行、从不并发，
 * 共用一组安全，且比"每函数一份"省下约 5KB。见产品级 RAM 溢出 L6406E） */
static FATFS fs;
static FIL fil;

#ifdef ENABLE_DESTRUCTIVE_TESTS
/* 性能缓冲 2048B = 恰好一个 NAND 页（RAM 预算：4096 时套件链接溢出 0x604，
 * L6406E 实测；2048 分块仍覆盖整页写路径，128KB 总量不变） */
static uint8_t s_perf_buf[2048];

/* TC-STORAGE-01: FTL 掉电恢复（journal 持久化）
 * 写文件并同步落盘，随后模拟掉电（卸载 + 复位 FTL + 重新 resume），再挂载校验内容一致。
 */
static void storage_test_powerloss(void)
{
    const uint32_t len = 4096;
    uint8_t wbuf[512];
    uint8_t rbuf[512];
    UINT bw, br;
    uint32_t i;
    int ok = 0;

    DBG_INFO("=== Storage Test: TC-STORAGE-01 Power-loss recovery ===");

    if (f_mount(&fs, "", 1) != FR_OK) {
        STORAGE_TEST_CHECK(0, "TC-STORAGE-01 mount");
        return;
    }

    /* Phase 1: 写已知内容文件并同步 */
    for (i = 0; i < sizeof(wbuf); i++) {
        wbuf[i] = (uint8_t)((i * 31 + 7) & 0xFF);
    }
    if (f_open(&fil, "pl.dat", FA_CREATE_ALWAYS | FA_WRITE) == FR_OK) {
        for (i = 0; i < len; i += sizeof(wbuf)) {
            f_write(&fil, wbuf, sizeof(wbuf), &bw);
        }
        f_sync(&fil);
        f_close(&fil);
    } else {
        STORAGE_TEST_CHECK(0, "TC-STORAGE-01 f_open(write)");
        return;
    }

    /* 模拟掉电：卸载 + 复位 FTL + 重新 resume */
    f_mount(&fs, "", 0);
    nand_ftl_deinit();
    nand_ftl_init();

    if (f_mount(&fs, "", 1) != FR_OK) {
        STORAGE_TEST_CHECK(0, "TC-STORAGE-01 remount after resume");
        return;
    }

    /* Phase 2: 重新打开校验 */
    if (f_open(&fil, "pl.dat", FA_READ) == FR_OK) {
        ok = 1;
        for (i = 0; i < len; i += sizeof(rbuf)) {
            f_read(&fil, rbuf, sizeof(rbuf), &br);
            for (uint32_t j = 0; j < br; j++) {
                if (rbuf[j] != (uint8_t)(((i + j) * 31 + 7) & 0xFF)) {
                    ok = 0;
                    break;
                }
            }
            if (!ok) break;
        }
        f_close(&fil);
    } else {
        ok = 0;
    }
    STORAGE_TEST_CHECK(ok, "TC-STORAGE-01 content survived power-loss (resume)");
    f_unlink("pl.dat");
}

/* TC-STORAGE-02: 大文件 / 多扇区 / 随机 seek
 * 写 256KB 位置相关模式文件，顺序读回比对 + 随机偏移 seek 读比对。
 * 栈预算：testTask 栈 4KB，局部缓冲 4096 必然溢出栈（8 月侥幸未爆是堆使用
 * 低），改 2048 = 恰好一个 NAND 整页，覆盖度等价。
 */
static void storage_test_largefile(void)
{
    const uint32_t total = 256 * 1024;
    const uint32_t chunk = 2048;
    uint8_t buf[2048];
    UINT bw, br;
    uint32_t off, i;
    int ok = 1;

    DBG_INFO("=== Storage Test: TC-STORAGE-02 Large file / random seek ===");

    if (f_mount(&fs, "", 1) != FR_OK) {
        STORAGE_TEST_CHECK(0, "TC-STORAGE-02 mount");
        return;
    }

    /* 写：位置相关模式 */
    if (f_open(&fil, "big.dat", FA_CREATE_ALWAYS | FA_WRITE) != FR_OK) {
        STORAGE_TEST_CHECK(0, "TC-STORAGE-02 f_open(write)");
        return;
    }
    for (off = 0; off < total; off += chunk) {
        for (i = 0; i < chunk; i++) {
            buf[i] = (uint8_t)(((off + i) * 31 + 7) & 0xFF);
        }
        f_write(&fil, buf, chunk, &bw);
    }
    f_close(&fil);

    /* 顺序读回 */
    if (f_open(&fil, "big.dat", FA_READ) != FR_OK) {
        STORAGE_TEST_CHECK(0, "TC-STORAGE-02 f_open(read)");
        return;
    }
    for (off = 0; off < total; off += chunk) {
        f_read(&fil, buf, chunk, &br);
        if (br != chunk) { ok = 0; break; }
        for (i = 0; i < chunk; i++) {
            if (buf[i] != (uint8_t)(((off + i) * 31 + 7) & 0xFF)) { ok = 0; break; }
        }
        if (!ok) break;
    }
    STORAGE_TEST_CHECK(ok, "TC-STORAGE-02 sequential 256KB read consistent");

    /* 随机 seek 读 */
    if (ok) {
        uint32_t seek_offs[] = { 0, 33333, 131072, 200000, total - 200 };
        int seek_ok = 1;
        for (int s = 0; s < 5; s++) {
            uint32_t so = seek_offs[s];
            uint32_t sc = 200;
            if (f_lseek(&fil, so) != FR_OK) { seek_ok = 0; break; }
            f_read(&fil, buf, sc, &br);
            for (i = 0; i < sc; i++) {
                if (buf[i] != (uint8_t)(((so + i) * 31 + 7) & 0xFF)) { seek_ok = 0; break; }
            }
            if (!seek_ok) break;
        }
        STORAGE_TEST_CHECK(seek_ok, "TC-STORAGE-02 random seek read consistent");
    }
    f_close(&fil);
    f_unlink("big.dat");
}

/* TC-STORAGE-03: 坏块注入下存储写入
 * 清空旧 map → 注入若干好块为坏（持久化） → 重建文件系统 → 正常写读 → 校验坏块仍被报告。
 */
static void storage_test_badblock(void)
{
    uint8_t wbuf[512], rbuf[512];
    UINT bw, br;
    uint32_t bad[3];
    int nbad = 0;
    int ok = 1;

    DBG_INFO("=== Storage Test: TC-STORAGE-03 Bad-block injection during storage ===");

    /* 清空旧 dhara map，避免后续注入的坏块被旧映射引用 */
    nand_ftl_format();

    /* 注入：挑出厂好块标记为坏（更新并持久化 BBT） */
    for (uint32_t b = 100; b < gd5f_get_usable_blocks() && nbad < 3; b++) {
        if (gd5f2gq5ue_is_block_bad(b) == 0) {
            gd5f2gq5ue_mark_block_bad(b);
            bad[nbad++] = b;
        }
    }
    if (nbad < 3) {
        STORAGE_TEST_CHECK(0, "TC-STORAGE-03 could not find 3 good blocks (got %d)", nbad);
        return;
    }
    STORAGE_TEST_CHECK(nbad == 3, "TC-STORAGE-03 injected %d bad blocks", nbad);

    /* 复位 FTL 使 dhara 经 is_block_bad 看到新坏块 */
    f_mount(&fs, "", 0);
    nand_ftl_deinit();
    nand_ftl_init();

    /* 重建文件系统（dhara 仍会跳过坏块） */
    {
        MKFS_PARM opts = { FM_FAT32, 0, 0, 0, 0 };
        uint8_t work[FF_MAX_SS];
        if (f_mkfs("", &opts, work, sizeof(work)) != FR_OK) {
            STORAGE_TEST_CHECK(0, "TC-STORAGE-03 f_mkfs");
            return;
        }
    }
    if (f_mount(&fs, "", 1) != FR_OK) {
        STORAGE_TEST_CHECK(0, "TC-STORAGE-03 mount");
        return;
    }

    /* 正常文件写读 */
    for (uint32_t i = 0; i < sizeof(wbuf); i++) {
        wbuf[i] = (uint8_t)((i * 17 + 3) & 0xFF);
    }
    if (f_open(&fil, "bbt.dat", FA_CREATE_ALWAYS | FA_WRITE) == FR_OK) {
        f_write(&fil, wbuf, sizeof(wbuf), &bw);
        f_close(&fil);
    } else {
        STORAGE_TEST_CHECK(0, "TC-STORAGE-03 f_open(write)");
        return;
    }

    if (f_open(&fil, "bbt.dat", FA_READ) == FR_OK) {
        f_read(&fil, rbuf, sizeof(rbuf), &br);
        f_close(&fil);
        if (br == sizeof(wbuf)) {
            for (uint32_t i = 0; i < sizeof(rbuf); i++) {
                if (rbuf[i] != wbuf[i]) { ok = 0; break; }
            }
        } else {
            ok = 0;
        }
    } else {
        ok = 0;
    }
    STORAGE_TEST_CHECK(ok, "TC-STORAGE-03 file intact with injected bad blocks");

    /* 校验注入坏块仍被报告为坏（未被 dhara 占用） */
    int badok = 1;
    for (int k = 0; k < nbad; k++) {
        if (gd5f2gq5ue_is_block_bad(bad[k]) != 1) { badok = 0; }
    }
    STORAGE_TEST_CHECK(badok, "TC-STORAGE-03 injected blocks still reported bad");

    f_unlink("bbt.dat");
    /* 注意：注入的坏块已持久化，测试设备专用；如需恢复需重建 BBT / 重新格式化
     * （配套 TC-STORAGE-04 恢复测试：storage_test.h 启用 ENABLE_STORAGE_RECOVERY_TESTS
     * 后跑一次套件，即可清除运行时注入坏块 + 清 dhara map 回出厂态） */
}

#endif /* ENABLE_DESTRUCTIVE_TESTS: s_perf_buf + TC-STORAGE-01/02/03（写、擦、坏块注入） */

/* TC-STORAGE-05: 文件名/路径合法性校验（守护 ".fschk 无限重格式化" 真根因）
 * 本移植 FF_USE_LFN=0，只支持严格 8.3 短名（主名≤8、扩展≤3、不以点开头）。
 * 非法名字 f_open 必返 FR_INVALID_NAME（纯 RAM 名字判定、不碰盘）；合法但
 * 不存在的名字返 FR_NO_FILE。本测试断言两类严格可区分——一旦哪天有人把
 * FR_INVALID_NAME 误归入"卷损坏"自愈集合，这条测试就是最后的机械防线。
 * （详见 docs/问题记录/GD5F2GQ5UE_Trap_Records.md TRAP-GD5F-05 / AGENTS.md）
 */
static void storage_test_name_validation(void)
{
    uint32_t i;
    int gok = 1;
    int bok = 1;

    /* 合法 8.3：FA_READ 打开 → FR_OK(存在) 或 FR_NO_FILE(不存在)，均非 INVALID */
    static const char *good[] = {
        "fschk.tmp",       /* 修复后的探针名（名5+扩展3） */
        "config.ini",      /* 名6+扩展3 */
        "12345678.txt",    /* 主名 8 / 扩展 3 上限 */
        "A.TXT",           /* 最小合法名 */
        "NOEXT",           /* 无扩展 */
        "1.23",            /* 数字名 */
        "run.log"
    };
    /* 非法：FF_USE_LFN=0 下 create_short 必拒 → FR_INVALID_NAME */
    static const char *bad[] = {
        ".fschk",          /* 事故根因：点开头（点后当扩展域，超 3 上限） */
        ".hidden",         /* 点开头隐藏名风格 */
        "123456789",       /* 主名 9 > 8 */
        "toolongname.txt", /* 主名 > 8 */
        "a.toolongext",    /* 扩展 > 3 */
        "bad?char.txt",    /* 非法字符 ? */
        "star*name",       /* * */
        "col:on",          /* : */
        "lt<gt>val",       /* < > */
        "pipe|name"        /* | */
    };

    DBG_INFO("=== Storage Test: TC-STORAGE-05 Filename validation ===");

    if (f_mount(&fs, "", 1) != FR_OK) {
        STORAGE_TEST_CHECK(0, "TC-STORAGE-05 mount");
        return;
    }

    for (i = 0; i < (uint32_t)(sizeof(good) / sizeof(good[0])); i++) {
        FRESULT r = f_open(&fil, good[i], FA_READ);
        if (r == FR_OK) {
            f_close(&fil);
        }
        if (r == FR_INVALID_NAME) {
            gok = 0;
            DBG_ERROR("  valid name wrongly rejected: '%s'", good[i]);
        }
    }
    STORAGE_TEST_CHECK(gok, "TC-STORAGE-05 valid 8.3 names accepted");

    for (i = 0; i < (uint32_t)(sizeof(bad) / sizeof(bad[0])); i++) {
        FRESULT r = f_open(&fil, bad[i], FA_READ);
        if (r == FR_OK) {
            f_close(&fil);
        }
        /* 含 ':' 的名字被 FatFs 先解析为盘符前缀 → FR_INVALID_DRIVE(11)
         * 同样属合法拒绝（台架实测 'col:on' fr=11），与 INVALID 同等待遇 */
        if ((r != FR_INVALID_NAME) &&
            !((r == FR_INVALID_DRIVE) && (strchr(bad[i], ':') != NULL))) {
            bok = 0;
            DBG_ERROR("  invalid name NOT rejected: '%s' -> fr=%d", bad[i], (int)r);
        }
    }
    STORAGE_TEST_CHECK(bok, "TC-STORAGE-05 invalid names rejected (FR_INVALID_NAME)");
}

#ifdef ENABLE_DESTRUCTIVE_TESTS
/* TC-STORAGE-06: 打开模式与写回字节数语义（守护 FA_OPEN_APPEND / 短写陷阱）
 * 本移植 FA_OPEN_APPEND 不含 FA_WRITE → 不带写位打开 f_write 必返 FR_DENIED；
 * 追加写必须 FA_WRITE|FA_OPEN_APPEND。另 f_write 簇耗尽返 FR_OK+短写（无错误
 * 码），判成败必须校验写回字节数。锁定这两条移植专有语义防回归。
 */
static void storage_test_open_modes(void)
{
    UINT bw;
    FRESULT r;

    DBG_INFO("=== Storage Test: TC-STORAGE-06 Open-mode semantics ===");

    if (f_mount(&fs, "", 1) != FR_OK) {
        STORAGE_TEST_CHECK(0, "TC-STORAGE-06 mount");
        return;
    }
    (void)f_unlink("mode.tmp");

    /* 1) 建一个含初始内容的文件 */
    r = f_open(&fil, "mode.tmp", FA_CREATE_ALWAYS | FA_WRITE);
    STORAGE_TEST_CHECK(r == FR_OK, "TC-STORAGE-06 create base file");
    if (r == FR_OK) {
        f_write(&fil, "abc", 3, &bw);
        f_close(&fil);
    }

    /* 2) FA_OPEN_APPEND（无 FA_WRITE）→ 写必返 FR_DENIED */
    r = f_open(&fil, "mode.tmp", FA_OPEN_APPEND);
    STORAGE_TEST_CHECK(r == FR_OK, "TC-STORAGE-06 open append(no write)");
    if (r == FR_OK) {
        FRESULT wr = f_write(&fil, "xyz", 3, &bw);
        STORAGE_TEST_CHECK(wr == FR_DENIED,
                           "TC-STORAGE-06 append-no-write must DENY (fr=%d)", (int)wr);
        f_close(&fil);
    }

    /* 3) FA_WRITE|FA_OPEN_APPEND → 追加成功且字节数正确 */
    r = f_open(&fil, "mode.tmp", FA_WRITE | FA_OPEN_APPEND);
    STORAGE_TEST_CHECK(r == FR_OK, "TC-STORAGE-06 open write|append");
    if (r == FR_OK) {
        (void)f_write(&fil, "xyz", 3, &bw);
        STORAGE_TEST_CHECK(bw == 3, "TC-STORAGE-06 append byte-count (%u)", bw);
        f_close(&fil);
    }

    /* 4) 只读打开后写 → 必返 FR_DENIED（读句柄不可写） */
    r = f_open(&fil, "mode.tmp", FA_READ);
    STORAGE_TEST_CHECK(r == FR_OK, "TC-STORAGE-06 open read-only");
    if (r == FR_OK) {
        FRESULT wr = f_write(&fil, "q", 1, &bw);
        STORAGE_TEST_CHECK(wr == FR_DENIED,
                           "TC-STORAGE-06 read-only write must DENY (fr=%d)", (int)wr);
        f_close(&fil);
    }

    (void)f_unlink("mode.tmp");
}
#endif /* ENABLE_DESTRUCTIVE_TESTS: TC-STORAGE-06 */
#endif /* !ENABLE_STORAGE_RECOVERY_TESTS: 共享缓冲 + 正常测试函数 */

#ifdef ENABLE_STORAGE_RECOVERY_TESTS
static void storage_test_recover(void);
#endif

#ifndef ENABLE_STORAGE_RECOVERY_TESTS
/* 正常存储测试套件主体（恢复模式见文件末尾 storage_test_run 分发） */
static void storage_test_run_normal(void)
{
    FRESULT res;

    memset(&g_storage_stats, 0, sizeof(g_storage_stats));

#ifdef ENABLE_DESTRUCTIVE_TESTS
    DBG_INFO("mode: DESTRUCTIVE (write/erase/format/badblock-inject enabled)");
#else
    DBG_INFO("mode: READ-ONLY (destructive cases skipped; set "
             "ENABLE_DESTRUCTIVE_TESTS in test_config.h to run them)");
#endif

    /* ==================== 挂载 ==================== */

    res = f_mount(&fs, "", 1);
#ifdef ENABLE_DESTRUCTIVE_TESTS
    if (res == FR_NO_FILESYSTEM) {
        static uint8_t work[FF_MAX_SS];
        MKFS_PARM opts = { FM_FAT32, 0, 0, 0, 0 };
        res = f_mkfs("", &opts, work, sizeof(work));
        STORAGE_TEST_CHECK(res == FR_OK, "f_mkfs");
        res = f_mount(&fs, "", 1);
    }
#else
    if (res == FR_NO_FILESYSTEM) {
        DBG_INFO("read-only mode: no filesystem on volume, skip write cases "
                 "(mkfs self-heal disabled)");
    }
#endif
    STORAGE_TEST_CHECK(res == FR_OK, "f_mount");

#ifdef ENABLE_DESTRUCTIVE_TESTS
    /* ==================== FTL + FatFS 文件系统测试 ==================== */
    {
        char read_buf[64];
        const char *test_str = "Hello FatFS + dhara FTL!";

        if (res == FR_OK) {
            UINT bw, br;

            res = f_open(&fil, "test.txt", FA_CREATE_ALWAYS | FA_WRITE);
            STORAGE_TEST_CHECK(res == FR_OK, "f_open(write)");
            if (res == FR_OK) {
                f_write(&fil, test_str, (UINT)strlen(test_str), &bw);
                STORAGE_TEST_CHECK(bw == (UINT)strlen(test_str), "f_write (%u bytes)", bw);
                f_close(&fil);

                res = f_open(&fil, "test.txt", FA_READ);
                STORAGE_TEST_CHECK(res == FR_OK, "f_open(read)");
                if (res == FR_OK) {
                    f_read(&fil, read_buf, (UINT)(sizeof(read_buf) - 1), &br);
                    f_close(&fil);
                    read_buf[br] = '\0';
                    STORAGE_TEST_CHECK(br == (UINT)strlen(test_str) &&
                                      memcmp(test_str, read_buf, br) == 0,
                                      "data verify \"%s\"", read_buf);
                }
            }
            f_unlink("test.txt");
        }
    }

    /* ==================== FTL + FatFS 性能测试 ==================== */

    DBG_INFO("=== Storage Test: Performance ===");

    {
        FIL pfile;
        UINT pw, pr;
        uint32_t t0, tw, tr;
        uint32_t i;
        uint32_t total_kb = 128;
        uint32_t chunk = sizeof(s_perf_buf);
        uint32_t count = (total_kb * 1024) / chunk;

        memset(s_perf_buf, 0xA5, sizeof(s_perf_buf));

        /* 写入 */
        t0 = HAL_GetTick();
        if (f_open(&pfile, "perf.dat", FA_CREATE_ALWAYS | FA_WRITE) == FR_OK) {
            for (i = 0; i < count; i++) {
                f_write(&pfile, s_perf_buf, chunk, &pw);
            }
            f_close(&pfile);
        }
        tw = HAL_GetTick() - t0;

        /* 读取 */
        t0 = HAL_GetTick();
        if (f_open(&pfile, "perf.dat", FA_READ) == FR_OK) {
            for (i = 0; i < count; i++) {
                f_read(&pfile, s_perf_buf, chunk, &pr);
            }
            f_close(&pfile);
        }
        tr = HAL_GetTick() - t0;

        f_unlink("perf.dat");

        if (tw > 0) {
            DBG_INFO("  Write: %lu KB in %lu ms = %lu KB/s",
                     total_kb, tw, (total_kb * 1000) / tw);
        }
        if (tr > 0) {
            DBG_INFO("  Read:  %lu KB in %lu ms = %lu KB/s",
                     total_kb, tr, (total_kb * 1000) / tr);
        }
    }
#endif /* ENABLE_DESTRUCTIVE_TESTS: 文件系统写读 + 性能压测 */

    /* ==================== 存储集成测试（TC-STORAGE-05 契约 + 01~03 集成） ========== */

    /* 纯语义契约测试（非破坏性）：文件名合法性 */
    storage_test_name_validation();

#ifdef ENABLE_DESTRUCTIVE_TESTS
    /* 破坏性用例：打开模式契约 + 掉电恢复 / 大文件 / 坏块注入集成 */
    storage_test_open_modes();
    storage_test_powerloss();
    storage_test_largefile();
    storage_test_badblock();
#endif

    /* ==================== 汇总报告 ==================== */

    STORAGE_TEST_REPORT("Storage Tests");
}
#endif /* !ENABLE_STORAGE_RECOVERY_TESTS */

/*
 * 套件总入口分发。恢复模式（storage_test.h 打开 ENABLE_STORAGE_RECOVERY_TESTS）
 * = 专用维护构建：重建 BBT（清除运行时误标坏块）+ 清 dhara map 后直接返回，
 * 不在受污染介质上继续跑其余测试（2026-09-20：CCM 首轮实验中 DMA 够不到栈上
 * 小缓冲，随机块被误标坏并持久化，journal 引用到即静默卡死——恢复模式即为其
 * 清账手段）。恢复完成后重新注释该宏、编译正常套件即可。
 */
void storage_test_run(void)
{
#ifdef ENABLE_STORAGE_RECOVERY_TESTS
    storage_test_recover();
    STORAGE_TEST_REPORT("Storage Recovery");
#else
    storage_test_run_normal();
#endif
}

#ifdef ENABLE_STORAGE_RECOVERY_TESTS

#ifdef STORAGE_RECOVERY_FULL_WIPE
/*
 * 函数功能：擦净 dhara 可见区全部块（容量恢复用）
 * 入口参数：无
 * 返回值：无
 * 限定条件：SPI/驱动已初始化；调用期间无其它存储访问（测试构建下单写者）
 * 函数说明：逐块擦除 [0, gd5f_get_usable_blocks())，跳过 BBT 记录的坏块，
 *           保留块池（BBT 存储区）不动。擦净后 journal checkpoint 不复存在，
 *           下次启动 dhara_map_resume 失败 → dhara_map_clear 全新初始化
 *           （bb_last = bb_current = 0）→ 容量回满。
 *           注意：擦净后**不能**再调 nand_ftl_format()（会把内存中仍带旧坏块
 *           计数的 journal 状态重新落盘，容量又被扣掉）。
 */
static void storage_test_wipe_visible(void)
{
    uint32_t usable = gd5f_get_usable_blocks();
    uint32_t done = 0;
    uint32_t skipped = 0;
    uint32_t b;

    for (b = 0; b < usable; b++) {
        if (gd5f2gq5ue_is_block_bad(b) != 0) {
            skipped++;
            continue;
        }
        if (gd5f_block_erase(b) == GD5F_OK) {
            done++;
        } else {
            DBG_ERROR("  block %lu erase failed", (unsigned long)b);
        }
        if ((b % 256U) == 0U) {
            DBG_INFO("  wipe progress: %lu/%lu", (unsigned long)b, (unsigned long)usable);
        }
    }

    DBG_INFO("  wiped %lu blocks (%lu skipped as bad, %lu visible)",
             (unsigned long)done, (unsigned long)skipped, (unsigned long)usable);
    STORAGE_TEST_CHECK(done > 0U, "TC-STORAGE-04 full wipe (%lu blocks erased)",
                       (unsigned long)done);
}
#endif /* STORAGE_RECOVERY_FULL_WIPE */

/* TC-STORAGE-04: 维护模式（恢复 = 重建 BBT + 重新格式化；叠加全片擦除 = 容量恢复）
 * 仅在启用 ENABLE_STORAGE_RECOVERY_TESTS 时编译运行；运行一次即可把设备
 * 恢复到干净出厂态（清除运行时注入坏块并清空 dhara map）。
 */
static void storage_test_recover(void)
{
    DBG_INFO("=== Storage Test: TC-STORAGE-04 maintenance (recovery / full wipe) ===");

    int r = gd5f2gq5ue_bbt_rebuild();
    STORAGE_TEST_CHECK(r == GD5F_OK, "TC-STORAGE-04 bbt rebuild");

#ifdef STORAGE_RECOVERY_FULL_WIPE
    storage_test_wipe_visible();
#else
    nand_ftl_format();
    STORAGE_TEST_CHECK(1, "TC-STORAGE-04 nand_ftl_format done");
#endif

    uint8_t fb[GD5F_TOTAL_BLOCKS / 8];
    uint32_t ver = 0;
    if (gd5f_bbt_dump_flash(fb, &ver) == GD5F_OK) {
        STORAGE_TEST_CHECK(ver >= 1, "TC-STORAGE-04 persisted BBT version=%lu", ver);
    } else {
        STORAGE_TEST_CHECK(0, "TC-STORAGE-04 dump_flash failed");
    }

#ifdef STORAGE_RECOVERY_FULL_WIPE
    DBG_INFO("TC-STORAGE-04 full wipe complete; power-cycle to rebuild fresh "
             "(capacity expected back to full)");
#else
    DBG_INFO("TC-STORAGE-04 recovery complete; recommend power-cycle to re-init cleanly");
#endif
}
#endif